Journal: SPIE Journal of Electronic Imaging

Areej S. Alfraih, Johann A. Briffa, and Stephan Wesemeyer. Cloning localization approach using k-means clustering and support vector machine. J. Electron. Imaging. 24 (4), 043019 (August 21, 2015); DOI: 10.1117/1.JEI.24.4.043019

Advertisements

Leave a Comment

Fill in your details below or click an icon to log in:

WordPress.com Logo

You are commenting using your WordPress.com account. Log Out / Change )

Twitter picture

You are commenting using your Twitter account. Log Out / Change )

Facebook photo

You are commenting using your Facebook account. Log Out / Change )

Google+ photo

You are commenting using your Google+ account. Log Out / Change )

Connecting to %s