Journal: SPIE Journal of Electronic Imaging

Areej S. Alfraih, Johann A. Briffa, and Stephan Wesemeyer. Cloning localization approach using k-means clustering and support vector machine. J. Electron. Imaging. 24 (4), 043019 (August 21, 2015); DOI: 10.1117/1.JEI.24.4.043019

Leave a Comment

Fill in your details below or click an icon to log in: Logo

You are commenting using your account. Log Out /  Change )

Twitter picture

You are commenting using your Twitter account. Log Out /  Change )

Facebook photo

You are commenting using your Facebook account. Log Out /  Change )

Connecting to %s

This site uses Akismet to reduce spam. Learn how your comment data is processed.